The effect of rapid atmospheric plasma treatment of FTO substrates on the quality of TiO2 blocking layers for printed perovskite solar cells
Identifikátory výsledku
Kód výsledku v IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216224%3A14310%2F21%3A00118955" target="_blank" >RIV/00216224:14310/21:00118955 - isvavai.cz</a>
Výsledek na webu
<a href="https://doi.org/10.1016/j.mssp.2021.105850" target="_blank" >https://doi.org/10.1016/j.mssp.2021.105850</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1016/j.mssp.2021.105850" target="_blank" >10.1016/j.mssp.2021.105850</a>
Alternativní jazyky
Jazyk výsledku
angličtina
Název v původním jazyce
The effect of rapid atmospheric plasma treatment of FTO substrates on the quality of TiO2 blocking layers for printed perovskite solar cells
Popis výsledku v původním jazyce
The aim of this work is to investigate and compare rapid ambient air atmospheric plasma treatment with time-consuming standard cleaning procedure for FTO substrates. Cleanliness has immediate and important effects on TiO2 blocking layers and subsequently on the photovoltaic performance of printed carbon-based perovskite solar cells (C–PSCs). The effects of the alternative approaches to FTO cleaning are characterized by XPS, Raman imaging spectroscopy, SEM, and optical microscopy. The C–PSCs treated with low-temperature atmospheric plasma for 10 s exhibited a similar conversion efficiency to that of cells prepared with FTO substrates cleaned by standard procedures (6% vs 6.1%). The results indicate that rapid plasma treatment of FTO substrates can be as effective as standard cleaning, which may employ various toxic organic solvents and time-consuming ultrasonic baths. The highest efficiency (6.3%) was achieved with C–PSCs for which the substrates had been cleaned by combined standard cleaning and 10-s plasma treatment. XPS and Raman measurements confirmed that both standard and plasma treatment significantly reduced organic residues and other contamination on FTO surfaces, enhancing the overall quality of TiO2 blocking layers and the performance of the whole solar device.
Název v anglickém jazyce
The effect of rapid atmospheric plasma treatment of FTO substrates on the quality of TiO2 blocking layers for printed perovskite solar cells
Popis výsledku anglicky
The aim of this work is to investigate and compare rapid ambient air atmospheric plasma treatment with time-consuming standard cleaning procedure for FTO substrates. Cleanliness has immediate and important effects on TiO2 blocking layers and subsequently on the photovoltaic performance of printed carbon-based perovskite solar cells (C–PSCs). The effects of the alternative approaches to FTO cleaning are characterized by XPS, Raman imaging spectroscopy, SEM, and optical microscopy. The C–PSCs treated with low-temperature atmospheric plasma for 10 s exhibited a similar conversion efficiency to that of cells prepared with FTO substrates cleaned by standard procedures (6% vs 6.1%). The results indicate that rapid plasma treatment of FTO substrates can be as effective as standard cleaning, which may employ various toxic organic solvents and time-consuming ultrasonic baths. The highest efficiency (6.3%) was achieved with C–PSCs for which the substrates had been cleaned by combined standard cleaning and 10-s plasma treatment. XPS and Raman measurements confirmed that both standard and plasma treatment significantly reduced organic residues and other contamination on FTO surfaces, enhancing the overall quality of TiO2 blocking layers and the performance of the whole solar device.
Klasifikace
Druh
J<sub>imp</sub> - Článek v periodiku v databázi Web of Science
CEP obor
—
OECD FORD obor
10305 - Fluids and plasma physics (including surface physics)
Návaznosti výsledku
Projekt
Výsledek vznikl pri realizaci vícero projektů. Více informací v záložce Projekty.
Návaznosti
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Ostatní
Rok uplatnění
2021
Kód důvěrnosti údajů
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Údaje specifické pro druh výsledku
Název periodika
Materials Science in Semiconductor Processing
ISSN
1369-8001
e-ISSN
—
Svazek periodika
131
Číslo periodika v rámci svazku
August
Stát vydavatele periodika
GB - Spojené království Velké Británie a Severního Irska
Počet stran výsledku
8
Strana od-do
„105850“
Kód UT WoS článku
000663423300004
EID výsledku v databázi Scopus
2-s2.0-85105245911