Non-equidistant scanning approach for millimetre-sized SPM measurements

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216224%3A14330%2F12%3A00080254" target="_blank" >RIV/00216224:14330/12:00080254 - isvavai.cz</a>

Výsledek na webu

<a href="http://dx.doi.org/10.1186/1556-276X-7-213" target="_blank" >http://dx.doi.org/10.1186/1556-276X-7-213</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1186/1556-276X-7-213" target="_blank" >10.1186/1556-276X-7-213</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Non-equidistant scanning approach for millimetre-sized SPM measurements

Popis výsledku v původním jazyce

Long-range scanning probe microscope (SPM) measurements are usually extremely time consuming as many data need to be collected, and the microscope probe speed is limited. In this article, we present an adaptive measurement method for a large-area SPM. Incontrast to the typically used line by line scanning with constant pixel spacing, we use an algorithm based on several levels of local refinement in order to minimize the amount of information that would be useless in the data processing phase. The dataobtained from the measurement are in general formed by xyz data sets that are triangulated back with a desired local resolution. This enables storing more relevant information from a single measurement as the data are interpolated and regularized in thedata processing phase instead of during the measurement. In this article, we also discuss the influence of thermal drifts on the measured data and compare the presented algorithm to the standard matrix-based measuring approach.

Název v anglickém jazyce

Non-equidistant scanning approach for millimetre-sized SPM measurements

Popis výsledku anglicky

Long-range scanning probe microscope (SPM) measurements are usually extremely time consuming as many data need to be collected, and the microscope probe speed is limited. In this article, we present an adaptive measurement method for a large-area SPM. Incontrast to the typically used line by line scanning with constant pixel spacing, we use an algorithm based on several levels of local refinement in order to minimize the amount of information that would be useless in the data processing phase. The dataobtained from the measurement are in general formed by xyz data sets that are triangulated back with a desired local resolution. This enables storing more relevant information from a single measurement as the data are interpolated and regularized in thedata processing phase instead of during the measurement. In this article, we also discuss the influence of thermal drifts on the measured data and compare the presented algorithm to the standard matrix-based measuring approach.

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

JB - Senzory, čidla, měření a regulace

OECD FORD obor

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Projekt

—

Návaznosti

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Rok uplatnění

2012

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Nanoscale Research Letters

ISSN

1931-7573

e-ISSN

—

Svazek periodika

7

Číslo periodika v rámci svazku

213

Stát vydavatele periodika

NL - Nizozemsko

Počet stran výsledku

7

Strana od-do

213-219

Kód UT WoS článku

000304306600001

EID výsledku v databázi Scopus

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