Multifractal analysis of drop-casted copper (II) tetrasulfophthalocyanine film surfaces on the indium tin oxide substrates

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216275%3A25310%2F14%3A39898649" target="_blank" >RIV/00216275:25310/14:39898649 - isvavai.cz</a>

Výsledek na webu

<a href="http://dx.doi.org/10.1002/sia.5492" target="_blank" >http://dx.doi.org/10.1002/sia.5492</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1002/sia.5492" target="_blank" >10.1002/sia.5492</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Multifractal analysis of drop-casted copper (II) tetrasulfophthalocyanine film surfaces on the indium tin oxide substrates

Popis výsledku v původním jazyce

This paper applies multifractal spectrum theory to characterize the structural complexity of 3D surface roughness of copper (II) tetrasulfophthalocyanine (CuTsPc) films on the indium tin oxide (ITO) substrate, obtained with atomic force microscopy (AFM)analysis. CuTsPc films were prepared by drop cast method on ITO substrate. CuTsPc films surface roughness was studied by AFM in tapping-mode, in air, on square areas of 2500 mu m(2). A novel approach, on the basis of computational algorithms for analysisof 3D roughness surface applied for AFM data, was presented. Results revealed that the 3D surface roughness of CuTsPc films prepared by drop cast method on ITO substrate can be described using the multifractal geometry. The generalized dimensions D-q and the multifractal spectrum f() provided quantitative values that characterize the local scale properties of CuTsPc films surface geometry at nanometer scale. Data provide valuable information to describe the spatial arrangement of 3D sur

Název v anglickém jazyce

Multifractal analysis of drop-casted copper (II) tetrasulfophthalocyanine film surfaces on the indium tin oxide substrates

Popis výsledku anglicky

This paper applies multifractal spectrum theory to characterize the structural complexity of 3D surface roughness of copper (II) tetrasulfophthalocyanine (CuTsPc) films on the indium tin oxide (ITO) substrate, obtained with atomic force microscopy (AFM)analysis. CuTsPc films were prepared by drop cast method on ITO substrate. CuTsPc films surface roughness was studied by AFM in tapping-mode, in air, on square areas of 2500 mu m(2). A novel approach, on the basis of computational algorithms for analysisof 3D roughness surface applied for AFM data, was presented. Results revealed that the 3D surface roughness of CuTsPc films prepared by drop cast method on ITO substrate can be described using the multifractal geometry. The generalized dimensions D-q and the multifractal spectrum f() provided quantitative values that characterize the local scale properties of CuTsPc films surface geometry at nanometer scale. Data provide valuable information to describe the spatial arrangement of 3D sur

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

CA - Anorganická chemie

OECD FORD obor

—

Projekt

Výsledek vznikl pri realizaci vícero projektů. Více informací v záložce Projekty.

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2014

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Surface and Interface Analysis

ISSN

0142-2421

e-ISSN

—

Svazek periodika

46

Číslo periodika v rámci svazku

6

Stát vydavatele periodika

US - Spojené státy americké

Počet stran výsledku

6

Strana od-do

393-398

Kód UT WoS článku

000335451600005

EID výsledku v databázi Scopus

—