Multifractal Characterization of Water Soluble Copper Phthalocyanine Based Films Surfaces

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216275%3A25310%2F14%3A39898651" target="_blank" >RIV/00216275:25310/14:39898651 - isvavai.cz</a>

Výsledek na webu

<a href="http://dx.doi.org/10.1007/s13391-013-3270-4" target="_blank" >http://dx.doi.org/10.1007/s13391-013-3270-4</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1007/s13391-013-3270-4" target="_blank" >10.1007/s13391-013-3270-4</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Multifractal Characterization of Water Soluble Copper Phthalocyanine Based Films Surfaces

Popis výsledku v původním jazyce

This paper presents a multifractal approach to characterize the structural complexity of 3D surface roughness of CuTsPc films on the glass and quartz substrate, obtained with atomic force microscopy (AFM) analysis. CuTsPc films prepared by drop cast method were investigated. CuTsPc films surface roughness was studied by AFM in tappingmode (TM), in an aqueous environment, on square areas of 100 mu m(2) and 2500 mu m(2). A detailed methodology for CuTsPc films surface multifractal characterization, whichmay be applied for AFM data, was also presented. Analysis of surface roughness revealed that CuTsPc films have a multifractal geometry at various magnifications. The generalized dimension D-q and the singularity spectrum f(alpha) provided quantitative values that characterize the local scale properties of CuTsPc films surface morphology at nanometer scale. Multifractal analysis provides different yet complementary information to that offered by traditional surface statistical parameters.

Název v anglickém jazyce

Multifractal Characterization of Water Soluble Copper Phthalocyanine Based Films Surfaces

Popis výsledku anglicky

This paper presents a multifractal approach to characterize the structural complexity of 3D surface roughness of CuTsPc films on the glass and quartz substrate, obtained with atomic force microscopy (AFM) analysis. CuTsPc films prepared by drop cast method were investigated. CuTsPc films surface roughness was studied by AFM in tappingmode (TM), in an aqueous environment, on square areas of 100 mu m(2) and 2500 mu m(2). A detailed methodology for CuTsPc films surface multifractal characterization, whichmay be applied for AFM data, was also presented. Analysis of surface roughness revealed that CuTsPc films have a multifractal geometry at various magnifications. The generalized dimension D-q and the singularity spectrum f(alpha) provided quantitative values that characterize the local scale properties of CuTsPc films surface morphology at nanometer scale. Multifractal analysis provides different yet complementary information to that offered by traditional surface statistical parameters.

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

CA - Anorganická chemie

OECD FORD obor

—

Projekt

Výsledek vznikl pri realizaci vícero projektů. Více informací v záložce Projekty.

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2014

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Electronic Materials Letters

ISSN

1738-8090

e-ISSN

—

Svazek periodika

10

Číslo periodika v rámci svazku

4

Stát vydavatele periodika

KR - Korejská republika

Počet stran výsledku

12

Strana od-do

719-730

Kód UT WoS článku

000339642600006

EID výsledku v databázi Scopus

—