Noncontact Scanning Force Microscopy ? a Computer Simulation of Resolution Limits

Kód výsledku v IS VaVaI

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Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

Noncontact Scanning Force Microscopy ? a Computer Simulation of Resolution Limits

Popis výsledku v původním jazyce

As generally known, in the noncontact mode the changes of effective resonance frequency of a cantilever with the tip-surface distance are used for imaging solid surfaces. For a long time, van der Waals attractive forces between atoms of the tip and surface atoms [1] had been considered to have a decisive influence for making a contrast in images taken by the noncontact mode of SFM. However, very recently the true atomic resolution on several surfaces by means of the noncontact UHV SFM have been obtaineed (e.g. Si, GaAs, InP, NaCl). This gives rise to questions if the long-range van der Waals forces themselves are capable to provide such an atomic resolution or if some additional short-range forces due to an onset of covalent bonds between atoms of thetip and surface atoms should not be taken into account as well. In [2] the true atomic resolution of the noncontact SFM is explained only by means of the long-range van der Waals forces and by nonlinear oscillations of the cantilever. How

Název v anglickém jazyce

Noncontact Scanning Force Microscopy ? a Computer Simulation of Resolution Limits

Popis výsledku anglicky

As generally known, in the noncontact mode the changes of effective resonance frequency of a cantilever with the tip-surface distance are used for imaging solid surfaces. For a long time, van der Waals attractive forces between atoms of the tip and surface atoms [1] had been considered to have a decisive influence for making a contrast in images taken by the noncontact mode of SFM. However, very recently the true atomic resolution on several surfaces by means of the noncontact UHV SFM have been obtaineed (e.g. Si, GaAs, InP, NaCl). This gives rise to questions if the long-range van der Waals forces themselves are capable to provide such an atomic resolution or if some additional short-range forces due to an onset of covalent bonds between atoms of thetip and surface atoms should not be taken into account as well. In [2] the true atomic resolution of the noncontact SFM is explained only by means of the long-range van der Waals forces and by nonlinear oscillations of the cantilever. How

Druh

D - Stať ve sborníku

CEP obor

BM - Fyzika pevných látek a magnetismus

OECD FORD obor

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Projekt

Výsledek vznikl pri realizaci vícero projektů. Více informací v záložce Projekty.

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)

Rok uplatnění

2001

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název statě ve sborníku

9th European Conference on Applications of Surface and Interface Analysis (ECASIA'01) Book of Abstracts

ISBN

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ISSN

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e-ISSN

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Počet stran výsledku

1

Strana od-do

285-285

Název nakladatele

P. Marcus, A. Galtayries, N. Frémy

Místo vydání

Avignon, France

Místo konání akce

Avignon

Datum konání akce

30. 9. 2001

Typ akce podle státní příslušnosti

WRD - Celosvětová akce

Kód UT WoS článku

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