Charge Carriers Transport and Noise of Niobium Capacitors

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F02%3APU30749" target="_blank" >RIV/00216305:26220/02:PU30749 - isvavai.cz</a>

Výsledek na webu

—

DOI - Digital Object Identifier

—

Jazyk výsledku

angličtina

Název v původním jazyce

Charge Carriers Transport and Noise of Niobium Capacitors

Popis výsledku v původním jazyce

A charge carriers transport mechanism and low frequency noise analysis has been performed on niobium capacitors to determine the mechanism of current flow and current noise sources, both in normal and reverse directions. The model of this MIS structure can be used to give a physical interpretation of the niobium capacitor characteristics and temperature dependences. In normal mode the V.A. characteristic can be approximated by Poole-Frenkel emission. In reverse mode two regions can be distinguished wiith respect to applied voltage. For applied voltage less than 0.5 V the V.A. characteristic can be approximated by exponential dependence of current on applied voltage. The noise spectral density varies approximately with the square of the leakage current,but it was frequently observed that the noise spectral density is related to the ?excess? component of the leakage current. This excess current is most likely to be localised in discrete regions, flaws or defects. The temperature depende

Název v anglickém jazyce

Charge Carriers Transport and Noise of Niobium Capacitors

Popis výsledku anglicky

A charge carriers transport mechanism and low frequency noise analysis has been performed on niobium capacitors to determine the mechanism of current flow and current noise sources, both in normal and reverse directions. The model of this MIS structure can be used to give a physical interpretation of the niobium capacitor characteristics and temperature dependences. In normal mode the V.A. characteristic can be approximated by Poole-Frenkel emission. In reverse mode two regions can be distinguished wiith respect to applied voltage. For applied voltage less than 0.5 V the V.A. characteristic can be approximated by exponential dependence of current on applied voltage. The noise spectral density varies approximately with the square of the leakage current,but it was frequently observed that the noise spectral density is related to the ?excess? component of the leakage current. This excess current is most likely to be localised in discrete regions, flaws or defects. The temperature depende

Druh

D - Stať ve sborníku

CEP obor

JA - Elektronika a optoelektronika, elektrotechnika

OECD FORD obor

—

Projekt

—

Návaznosti

Z - Vyzkumny zamer (s odkazem do CEZ)

Rok uplatnění

2002

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název statě ve sborníku

CARTS-EUROPE 2002 Proceedings, 16th European Passive Components Conference

ISBN

—

ISSN

—

e-ISSN

—

Počet stran výsledku

5

Strana od-do

32-36

Název nakladatele

Electronic Components Institute Internationale Ltd.

Místo vydání

Swindon, England

Místo konání akce

Port St. Laurent, Francie

Datum konání akce

14. 10. 2002

Typ akce podle státní příslušnosti

WRD - Celosvětová akce

Kód UT WoS článku

—