Noise and Non-Linearity Testing of Electronic Components

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F03%3APU39273" target="_blank" >RIV/00216305:26220/03:PU39273 - isvavai.cz</a>

Výsledek na webu

—

DOI - Digital Object Identifier

—

Jazyk výsledku

čeština

Název v původním jazyce

Noise and Non-Linearity Testing of Electronic Components

Popis výsledku v původním jazyce

Nowadays the microelectronics device manufacturers are faced with high requirements on quality and reliability of their products, the required failure intensity ranging form 1 fit (bipolar npn or pnp devices) over 10 fits (bipolar TTL) to 100 fits (bipolar operational amplifiers). Traditional methods to ascertain reliability consisting in ageing tests are in this case no more applicable. This is due to of enormous requirements on the ageing periond and number of specimens. Therefore a search for new nonn-destructive methods to characterise quality and predict reliability of vast ensembles became a trend in the last two decades. One of the most promising methods to provide a non-destructive active and passive components, i.e., bipolar and MOS structures, on one hand, and resistors and capacitors on the other. As a main diagnostic tool it is proposed to use low frequency noise and third harmonic index and theirs statistical distributions.

Název v anglickém jazyce

Noise and Non-Linearity Testing of Electronic Components

Popis výsledku anglicky

Nowadays the microelectronics device manufacturers are faced with high requirements on quality and reliability of their products, the required failure intensity ranging form 1 fit (bipolar npn or pnp devices) over 10 fits (bipolar TTL) to 100 fits (bipolar operational amplifiers). Traditional methods to ascertain reliability consisting in ageing tests are in this case no more applicable. This is due to of enormous requirements on the ageing periond and number of specimens. Therefore a search for new nonn-destructive methods to characterise quality and predict reliability of vast ensembles became a trend in the last two decades. One of the most promising methods to provide a non-destructive active and passive components, i.e., bipolar and MOS structures, on one hand, and resistors and capacitors on the other. As a main diagnostic tool it is proposed to use low frequency noise and third harmonic index and theirs statistical distributions.

Druh

D - Stať ve sborníku

CEP obor

JA - Elektronika a optoelektronika, elektrotechnika

OECD FORD obor

—

Projekt

<a href="/cs/project/GA103%2F01%2F1058" target="_blank" >GA103/01/1058: Elektromagnetická a akustická emise v pevných látkách</a><br>

Návaznosti

Z - Vyzkumny zamer (s odkazem do CEZ)

Rok uplatnění

2003

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název statě ve sborníku

Noise and Non-linearity Testing of Modern Electronic Components

ISBN

80-238-9094-8

ISSN

—

e-ISSN

—

Počet stran výsledku

10

Strana od-do

18-27

Název nakladatele

CNRL

Místo vydání

Brno

Místo konání akce

Brno

Datum konání akce

12. 8. 2001

Typ akce podle státní příslušnosti

WRD - Celosvětová akce

Kód UT WoS článku

—