Non-destructive testing of passive electronic components

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F10%3APU89310" target="_blank" >RIV/00216305:26220/10:PU89310 - isvavai.cz</a>

Nalezeny alternativní kódy

RIV/00216305:26220/10:PU89313

Výsledek na webu

—

DOI - Digital Object Identifier

—

Jazyk výsledku

angličtina

Název v původním jazyce

Non-destructive testing of passive electronic components

Popis výsledku v původním jazyce

My focus up to now was oriented to the experimental methods serving for the evaluation of quality and reliability of the passive electronic components. Most of the work was done on the cermet and polymers based thick film resistors and tantalum and niobium oxide capacitors. My inaugural dissertation consists of two parts: the first one summarizes the measuring methods and their possible utilization for resistors and capacitors evaluation; in the second one my most important papers dealing with this subject are enclosed. The overview on my work done during last ten years on the Physics Department of Faculty of Electrical Engineering and Communication of Brno University of Technology is given. Reliability of electronic devices is caused predominantly byfailures which result from the latent defects created during the manufacture processes or during the operating life of the devices. A search for non-destructive methods to characterize quality and predict reliability of vast ensembles bec

Název v anglickém jazyce

Non-destructive testing of passive electronic components

Popis výsledku anglicky

My focus up to now was oriented to the experimental methods serving for the evaluation of quality and reliability of the passive electronic components. Most of the work was done on the cermet and polymers based thick film resistors and tantalum and niobium oxide capacitors. My inaugural dissertation consists of two parts: the first one summarizes the measuring methods and their possible utilization for resistors and capacitors evaluation; in the second one my most important papers dealing with this subject are enclosed. The overview on my work done during last ten years on the Physics Department of Faculty of Electrical Engineering and Communication of Brno University of Technology is given. Reliability of electronic devices is caused predominantly byfailures which result from the latent defects created during the manufacture processes or during the operating life of the devices. A search for non-destructive methods to characterize quality and predict reliability of vast ensembles bec

Druh

O - Ostatní výsledky

CEP obor

JA - Elektronika a optoelektronika, elektrotechnika

OECD FORD obor

—

Projekt

—

Návaznosti

Z - Vyzkumny zamer (s odkazem do CEZ)

Rok uplatnění

2010

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů