Řízení dynamiky sond SPM v nedestruktivní defektoskopii

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F05%3APU48731" target="_blank" >RIV/00216305:26220/05:PU48731 - isvavai.cz</a>

Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

Control of Dynamics of SPM Probes for Non-destructive defectoscopy

Popis výsledku v původním jazyce

Paper describes a control of dynamics of Scanning Probe Microscopy (SPM) and especially STM microscope probes, which are going to be used for non-destructive defectoscopy on surface and subsurface layers of material with nanometer resolution. STM microscope is based on an electron tunnel effect. The tunnel effect proceeds between a probe and a tested sample, where a probe disturbs so called near-field of the material. A principle of STM microscope allows get an information only from material spot whichis just under the probe. Therefore have to be used a manipulator to move with the sample under probe to scan whole surface of the material. The piezonanomanipulator is necessary to this movement, this instrument provide movement under the probe with high accuracy of few nanometers. The nanomanipulator can move itself in 3 axis x,y,z, a movement is realized by the help of piezo-crystals, these are feeding by the voltage from &#61485;2 to +12 V. Paper is focused on the quality of used nan

Název v anglickém jazyce

Control of Dynamics of SPM Probes for Non-destructive defectoscopy

Popis výsledku anglicky

Paper describes a control of dynamics of Scanning Probe Microscopy (SPM) and especially STM microscope probes, which are going to be used for non-destructive defectoscopy on surface and subsurface layers of material with nanometer resolution. STM microscope is based on an electron tunnel effect. The tunnel effect proceeds between a probe and a tested sample, where a probe disturbs so called near-field of the material. A principle of STM microscope allows get an information only from material spot whichis just under the probe. Therefore have to be used a manipulator to move with the sample under probe to scan whole surface of the material. The piezonanomanipulator is necessary to this movement, this instrument provide movement under the probe with high accuracy of few nanometers. The nanomanipulator can move itself in 3 axis x,y,z, a movement is realized by the help of piezo-crystals, these are feeding by the voltage from &#61485;2 to +12 V. Paper is focused on the quality of used nan

Druh

D - Stať ve sborníku

CEP obor

JA - Elektronika a optoelektronika, elektrotechnika

OECD FORD obor

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Projekt

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Návaznosti

Z - Vyzkumny zamer (s odkazem do CEZ)

Rok uplatnění

2005

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název statě ve sborníku

Proceedings of XXXth Seminary XXX ASR'05:Instruments and Control '05

ISBN

80-248-0774-2

ISSN

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e-ISSN

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Počet stran výsledku

8

Strana od-do

30-37

Název nakladatele

VŠB TU Ostrava

Místo vydání

Ostrava

Místo konání akce

Ostrava

Datum konání akce

30. 4. 2004

Typ akce podle státní příslušnosti

CST - Celostátní akce

Kód UT WoS článku

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