Power efficiency of tapered probe and its influence on resolution in Scanning near-field optical microscopy

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F10%3APU88022" target="_blank" >RIV/00216305:26220/10:PU88022 - isvavai.cz</a>

Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

Power efficiency of tapered probe and its influence on resolution in Scanning near-field optical microscopy

Popis výsledku v původním jazyce

Novel optical techniques such as near-field come in a study of local properties of transparent or opaque microscopic structures such as optical waveguides, optoelectronic integrated circuits, photonic crystals, semiconductor interfaces, nanostructured systems. To control a light-matter interaction at nanometer distance, structures guiding electromagnetic energy with lateral mode confinement below the diffraction limit of light are necessary. Tapered optical fiber probe is a crucial part of the system, governs its resolution, and simultaneously could play role as light source and/or detector. The paper brings a simulation of losses, taking into account its correctly described geometry, as well as experimental verification of resolution obtained with this probe.

Název v anglickém jazyce

Power efficiency of tapered probe and its influence on resolution in Scanning near-field optical microscopy

Popis výsledku anglicky

Novel optical techniques such as near-field come in a study of local properties of transparent or opaque microscopic structures such as optical waveguides, optoelectronic integrated circuits, photonic crystals, semiconductor interfaces, nanostructured systems. To control a light-matter interaction at nanometer distance, structures guiding electromagnetic energy with lateral mode confinement below the diffraction limit of light are necessary. Tapered optical fiber probe is a crucial part of the system, governs its resolution, and simultaneously could play role as light source and/or detector. The paper brings a simulation of losses, taking into account its correctly described geometry, as well as experimental verification of resolution obtained with this probe.

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

JA - Elektronika a optoelektronika, elektrotechnika

OECD FORD obor

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Projekt

<a href="/cs/project/GA102%2F08%2F1474" target="_blank" >GA102/08/1474: Lokální optická a elektrická charakterizace optoelektronických struktur s nanometrickým rozlišením</a><br>

Návaznosti

Z - Vyzkumny zamer (s odkazem do CEZ)

Rok uplatnění

2010

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Acta Electrotechnica et Informatica

ISSN

1335-8243

e-ISSN

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Svazek periodika

10

Číslo periodika v rámci svazku

3

Stát vydavatele periodika

SK - Slovenská republika

Počet stran výsledku

5

Strana od-do

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Kód UT WoS článku

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EID výsledku v databázi Scopus

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