PN junction defects detection in solar cells using noise diagnostics

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F11%3APU90188" target="_blank" >RIV/00216305:26220/11:PU90188 - isvavai.cz</a>

Výsledek na webu

—

DOI - Digital Object Identifier

—

Jazyk výsledku

angličtina

Název v původním jazyce

PN junction defects detection in solar cells using noise diagnostics

Popis výsledku v původním jazyce

PN junction is one of the most important parts of solar cells. Its quality affects lifetime and efficiency of solar cells. Local defects which appear in PN junctions during the manufacture process are very important from this point of view. These are caused by localized areas with high donor or acceptor doping agents, impurities, dislocations or other mechanisms which effect in lower breakdown voltage of PN junction in reverse bias. Several base methods can be used for solar cells nondestructive diagnostics. Measuring methods of low-band noise current effective value with reverse bias junction were used in this paper. This method allows detection of local defects and volume degradation in PN junctions of solar cells and it can be used for detection ofmicroplasma noise. This noise is an impulse noise and it is caused by local avalanche breakdowns in small area of the junction. It can be recognized by two or more level random square current pulses with constant height, random appearance

Název v anglickém jazyce

PN junction defects detection in solar cells using noise diagnostics

Popis výsledku anglicky

PN junction is one of the most important parts of solar cells. Its quality affects lifetime and efficiency of solar cells. Local defects which appear in PN junctions during the manufacture process are very important from this point of view. These are caused by localized areas with high donor or acceptor doping agents, impurities, dislocations or other mechanisms which effect in lower breakdown voltage of PN junction in reverse bias. Several base methods can be used for solar cells nondestructive diagnostics. Measuring methods of low-band noise current effective value with reverse bias junction were used in this paper. This method allows detection of local defects and volume degradation in PN junctions of solar cells and it can be used for detection ofmicroplasma noise. This noise is an impulse noise and it is caused by local avalanche breakdowns in small area of the junction. It can be recognized by two or more level random square current pulses with constant height, random appearance

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

BM - Fyzika pevných látek a magnetismus

OECD FORD obor

—

Projekt

<a href="/cs/project/GAP102%2F10%2F2013" target="_blank" >GAP102/10/2013: Fluktuační procesy v PN přechodech solárních článků</a><br>

Návaznosti

Z - Vyzkumny zamer (s odkazem do CEZ)

Rok uplatnění

2011

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Key Engineering Materials

ISSN

1662-9795

e-ISSN

—

Svazek periodika

465

Číslo periodika v rámci svazku

1

Stát vydavatele periodika

CH - Švýcarská konfederace

Počet stran výsledku

4

Strana od-do

—

Kód UT WoS článku

—

EID výsledku v databázi Scopus

—