Influence of Functional Resistors on Offset Voltage Noise in Thick-Film Pressure Sensors

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F12%3APU101130" target="_blank" >RIV/00216305:26220/12:PU101130 - isvavai.cz</a>

Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

Influence of Functional Resistors on Offset Voltage Noise in Thick-Film Pressure Sensors

Popis výsledku v původním jazyce

We are concentrating our effort on the investigation of Low-Temperature Co-fired Ceramic (LTCC)-based ceramic pressure sensors (CPSs) quality and reliability using the low frequency noise measurements. Special test specimens containing thick film resistors of different sizes including four thick-film resistors (0.8 x 0.8 mm2) connected in the Wheatstone bridge were made for the case study by using different thick-film materials and technology variants. In the present work we will discuss the correlationbetween the functional resistor parameters (resistance and layer thickness, respectively) and the noise level of single resistors, as well as the correlation between the bridge offset voltage fluctuation and the noise of single resistors within the bridge. For given sample geometry the sample resistance increases with decreasing thickness of the resistive layer. Thinner resistors have smaller volume of resistive layer which leads to the increase of 1/f noise component. The discussion ho

Název v anglickém jazyce

Influence of Functional Resistors on Offset Voltage Noise in Thick-Film Pressure Sensors

Popis výsledku anglicky

We are concentrating our effort on the investigation of Low-Temperature Co-fired Ceramic (LTCC)-based ceramic pressure sensors (CPSs) quality and reliability using the low frequency noise measurements. Special test specimens containing thick film resistors of different sizes including four thick-film resistors (0.8 x 0.8 mm2) connected in the Wheatstone bridge were made for the case study by using different thick-film materials and technology variants. In the present work we will discuss the correlationbetween the functional resistor parameters (resistance and layer thickness, respectively) and the noise level of single resistors, as well as the correlation between the bridge offset voltage fluctuation and the noise of single resistors within the bridge. For given sample geometry the sample resistance increases with decreasing thickness of the resistive layer. Thinner resistors have smaller volume of resistive layer which leads to the increase of 1/f noise component. The discussion ho

Druh

D - Stať ve sborníku

CEP obor

JA - Elektronika a optoelektronika, elektrotechnika

OECD FORD obor

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Projekt

<a href="/cs/project/MEB091129" target="_blank" >MEB091129: Šumová diagnostika tlustovrstvových senzorů tlaku</a><br>

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2012

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název statě ve sborníku

MIDEM Society for Microelectronic, Electronic Components and Materials - Conference 2012 Proceedings

ISBN

978-961-92933-2-4

ISSN

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e-ISSN

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Počet stran výsledku

6

Strana od-do

393-398

Název nakladatele

MIDEM

Místo vydání

Slovinsko

Místo konání akce

Otočec Slovenia

Datum konání akce

19. 9. 2012

Typ akce podle státní příslušnosti

WRD - Celosvětová akce

Kód UT WoS článku

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