Optical and electrical detection and localization of solar cell defects on microscale

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F13%3APU105342" target="_blank" >RIV/00216305:26220/13:PU105342 - isvavai.cz</a>

Výsledek na webu

<a href="http://dx.doi.org/10.1117/12.2023265" target="_blank" >http://dx.doi.org/10.1117/12.2023265</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1117/12.2023265" target="_blank" >10.1117/12.2023265</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Optical and electrical detection and localization of solar cell defects on microscale

Popis výsledku v původním jazyce

Monocrystalline silicon wafer is up-to-date most used material for the fabrication of solar cells. The recent investigation shows that the quality of cells is often degraded by structural defects emerging during processing steps. Hence the paper gives first an overview of solar cell efficiency investigation on macroscale. Then a detection and microscale localization of tiny local defects in solar cell structures which evidently affect electrical and photoelectrical properties of the cells is targeted. The local defects can be classified as microfractures, precipitates and other material structure inhomogeneities. Detection and localization of the defects in the structure and the assigning of particular defects to corresponding degradation of photoelectrical parameters are key points for solar cell lifetime and efficiency improvement. Although the breakdown can be evident in current-voltage plot, the localization of defects on the sample has to be provided by microscopic investigations

Název v anglickém jazyce

Optical and electrical detection and localization of solar cell defects on microscale

Popis výsledku anglicky

Monocrystalline silicon wafer is up-to-date most used material for the fabrication of solar cells. The recent investigation shows that the quality of cells is often degraded by structural defects emerging during processing steps. Hence the paper gives first an overview of solar cell efficiency investigation on macroscale. Then a detection and microscale localization of tiny local defects in solar cell structures which evidently affect electrical and photoelectrical properties of the cells is targeted. The local defects can be classified as microfractures, precipitates and other material structure inhomogeneities. Detection and localization of the defects in the structure and the assigning of particular defects to corresponding degradation of photoelectrical parameters are key points for solar cell lifetime and efficiency improvement. Although the breakdown can be evident in current-voltage plot, the localization of defects on the sample has to be provided by microscopic investigations

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

JA - Elektronika a optoelektronika, elektrotechnika

OECD FORD obor

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Projekt

Výsledek vznikl pri realizaci vícero projektů. Více informací v záložce Projekty.

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2013

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Proceedings of SPIE

ISSN

0277-786X

e-ISSN

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Svazek periodika

8825

Číslo periodika v rámci svazku

8825

Stát vydavatele periodika

US - Spojené státy americké

Počet stran výsledku

8

Strana od-do

8825071-88255077

Kód UT WoS článku

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EID výsledku v databázi Scopus

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