Run-Time Reconfigurable Fault Tolerant Architecture for Soft-Core Processor neo430
Identifikátory výsledku
Kód výsledku v IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26230%2F19%3APU132060" target="_blank" >RIV/00216305:26230/19:PU132060 - isvavai.cz</a>
Výsledek na webu
<a href="https://www.fit.vut.cz/research/publication/11905/" target="_blank" >https://www.fit.vut.cz/research/publication/11905/</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1109/DDECS.2019.8724636" target="_blank" >10.1109/DDECS.2019.8724636</a>
Alternativní jazyky
Jazyk výsledku
angličtina
Název v původním jazyce
Run-Time Reconfigurable Fault Tolerant Architecture for Soft-Core Processor neo430
Popis výsledku v původním jazyce
Reconfigurable fault tolerant (FT) architecture can be implemented into SRAM FPGA by using combination of Partial Dynamic Reconfiguration (PDR) and Triple Modular Redundancy (TMR). SRAM FPGAs are susceptible to Single Event Upsets (SEUs) which are the most common transient faults induced by cosmic radiation. SEU mitigation mechanism is required when SRAM FPGAs are integrated into safety-critical systems. An essential requirement for these systems is often to remain fail-operational and perform implemented functionality after the occurrence of a fault. In our research, we proposed a run-time FT architecture based on coarse-grained TMR with triplicated soft-core processor neo430, PDR for removing all transient SEU faults and the state synchronization allowing smooth state recovery from the inconsistent state when reconfiguration of failed processor instance was finished into the state where all three processors operate synchronously. This paper describes developed FT architecture and fault recovery strategy performing all necessary steps run-time and without additional blocking of the system functionality. The state synchronization for soft-core processor neo430 architecture is described in detail. Moreover, the paper presents developed PDR framework used for validation of proposed fault recovery strategy.
Název v anglickém jazyce
Run-Time Reconfigurable Fault Tolerant Architecture for Soft-Core Processor neo430
Popis výsledku anglicky
Reconfigurable fault tolerant (FT) architecture can be implemented into SRAM FPGA by using combination of Partial Dynamic Reconfiguration (PDR) and Triple Modular Redundancy (TMR). SRAM FPGAs are susceptible to Single Event Upsets (SEUs) which are the most common transient faults induced by cosmic radiation. SEU mitigation mechanism is required when SRAM FPGAs are integrated into safety-critical systems. An essential requirement for these systems is often to remain fail-operational and perform implemented functionality after the occurrence of a fault. In our research, we proposed a run-time FT architecture based on coarse-grained TMR with triplicated soft-core processor neo430, PDR for removing all transient SEU faults and the state synchronization allowing smooth state recovery from the inconsistent state when reconfiguration of failed processor instance was finished into the state where all three processors operate synchronously. This paper describes developed FT architecture and fault recovery strategy performing all necessary steps run-time and without additional blocking of the system functionality. The state synchronization for soft-core processor neo430 architecture is described in detail. Moreover, the paper presents developed PDR framework used for validation of proposed fault recovery strategy.
Klasifikace
Druh
D - Stať ve sborníku
CEP obor
—
OECD FORD obor
20206 - Computer hardware and architecture
Návaznosti výsledku
Projekt
<a href="/cs/project/LQ1602" target="_blank" >LQ1602: IT4Innovations excellence in science</a><br>
Návaznosti
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>S - Specificky vyzkum na vysokych skolach
Ostatní
Rok uplatnění
2019
Kód důvěrnosti údajů
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Údaje specifické pro druh výsledku
Název statě ve sborníku
22nd International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS 2019)
ISBN
978-1-7281-0073-9
ISSN
—
e-ISSN
—
Počet stran výsledku
4
Strana od-do
136-140
Název nakladatele
IEEE Computer Society
Místo vydání
Cluj-Napoca
Místo konání akce
Cluj-Napoca
Datum konání akce
24. 4. 2019
Typ akce podle státní příslušnosti
WRD - Celosvětová akce
Kód UT WoS článku
000492839800003