On the Influence of the Laser Illumination on the Logic Cells Current Consumption : First measurement results

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F49777513%3A23220%2F23%3A43970554" target="_blank" >RIV/49777513:23220/23:43970554 - isvavai.cz</a>

Nalezeny alternativní kódy

RIV/68407700:21240/23:00371357

Výsledek na webu

<a href="https://ieeexplore.ieee.org/document/10382757" target="_blank" >https://ieeexplore.ieee.org/document/10382757</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1109/ICECS58634.2023.10382757" target="_blank" >10.1109/ICECS58634.2023.10382757</a>

Jazyk výsledku

angličtina

Název v původním jazyce

On the Influence of the Laser Illumination on the Logic Cells Current Consumption : First measurement results

Popis výsledku v původním jazyce

Physical side-channel attacks represent a great challenge for today’s chip design. Although attacks on CMOS dynamic power represent a class of state-of-the-art attacks, many other effects potentially affect the security of CMOS chips analogously by affecting mostly static behaviour of the chip, including aging, ionizing radiation, or non-ionizing illumination of the CMOS. Vulnerabilities exploiting data dependency in CMOS static power were already demonstrated in practice and the analogous vulnerability exploiting light-modulated static power was demonstrated by simulation. This work confirms the CMOS vulnerability related to the light-modulated data-dependent static power experimentally and discusses future work.

Název v anglickém jazyce

On the Influence of the Laser Illumination on the Logic Cells Current Consumption : First measurement results

Popis výsledku anglicky

Physical side-channel attacks represent a great challenge for today’s chip design. Although attacks on CMOS dynamic power represent a class of state-of-the-art attacks, many other effects potentially affect the security of CMOS chips analogously by affecting mostly static behaviour of the chip, including aging, ionizing radiation, or non-ionizing illumination of the CMOS. Vulnerabilities exploiting data dependency in CMOS static power were already demonstrated in practice and the analogous vulnerability exploiting light-modulated static power was demonstrated by simulation. This work confirms the CMOS vulnerability related to the light-modulated data-dependent static power experimentally and discusses future work.

Druh

D - Stať ve sborníku

CEP obor

—

OECD FORD obor

20206 - Computer hardware and architecture

Projekt

—

Návaznosti

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Rok uplatnění

2023

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název statě ve sborníku

Proceedings of the 30th IEEE International Conference on Electronics, Circuits and Systems (ICECS 2023)

ISBN

979-8-3503-2649-9

ISSN

—

e-ISSN

—

Počet stran výsledku

6

Strana od-do

1-6

Název nakladatele

IEEE

Místo vydání

Piscataway

Místo konání akce

Istanbul, Turkey

Datum konání akce

4. 12. 2023

Typ akce podle státní příslušnosti

WRD - Celosvětová akce

Kód UT WoS článku

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