Methodology of evaluating the influence of the resistance of contact regions in the measurement of sheet resistance on stripes of ultrathin high-resistance materials

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F60461373%3A22310%2F12%3A43893763" target="_blank" >RIV/60461373:22310/12:43893763 - isvavai.cz</a>

Nalezeny alternativní kódy

RIV/60461373:22340/12:43893763

Výsledek na webu

<a href="http://dx.doi.org/10.1063/1.4731654" target="_blank" >http://dx.doi.org/10.1063/1.4731654</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1063/1.4731654" target="_blank" >10.1063/1.4731654</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Methodology of evaluating the influence of the resistance of contact regions in the measurement of sheet resistance on stripes of ultrathin high-resistance materials

Popis výsledku v původním jazyce

The paper reviews the problems of measurement of sheet resistance of ultrathin high-resistance lay-ers of organic semiconductors and the essential underlying problems. Particular attention is paid to potential influence of the resistance of contact regions on the results of direct measurement of sheet resistance of stripe-shaped layers. In this connection, we present a methodology of double length stripe resistance measurement (DLSRM), used above all to minimise the influence of contact regions on the measurement results. We deduce theoretical as well as practical possibilities of DLSRM in the diagnostics and quantitative characterisation of unsuitable or even faulty contacts on high-resistance layers. The application efficiency of the DLSRM method isdocumented by the results of sheet resistance measurement on zinc phthalocyanine with cathode sputtered planar contacts of noble metals (gold, platinum, or palladium). As expected, gold is the best contact material, but even in its applic

Název v anglickém jazyce

Methodology of evaluating the influence of the resistance of contact regions in the measurement of sheet resistance on stripes of ultrathin high-resistance materials

Popis výsledku anglicky

The paper reviews the problems of measurement of sheet resistance of ultrathin high-resistance lay-ers of organic semiconductors and the essential underlying problems. Particular attention is paid to potential influence of the resistance of contact regions on the results of direct measurement of sheet resistance of stripe-shaped layers. In this connection, we present a methodology of double length stripe resistance measurement (DLSRM), used above all to minimise the influence of contact regions on the measurement results. We deduce theoretical as well as practical possibilities of DLSRM in the diagnostics and quantitative characterisation of unsuitable or even faulty contacts on high-resistance layers. The application efficiency of the DLSRM method isdocumented by the results of sheet resistance measurement on zinc phthalocyanine with cathode sputtered planar contacts of noble metals (gold, platinum, or palladium). As expected, gold is the best contact material, but even in its applic

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

JB - Senzory, čidla, měření a regulace

OECD FORD obor

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Projekt

<a href="/cs/project/GAP108%2F11%2F1298" target="_blank" >GAP108/11/1298: Detekční vrstvy na bázi kompozitů organokomplexů s nanočásticemi pro chemické senzory</a><br>

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)<br>S - Specificky vyzkum na vysokych skolach

Rok uplatnění

2012

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

REVIEW OF SCIENTIFIC INSTRUMENTS

ISSN

0034-6748

e-ISSN

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Svazek periodika

83

Číslo periodika v rámci svazku

3.7.2012

Stát vydavatele periodika

US - Spojené státy americké

Počet stran výsledku

10

Strana od-do

"074701-1"-"074701-10"

Kód UT WoS článku

000307527900043

EID výsledku v databázi Scopus

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