PDMS-A simple and effective platform for determining Young's modulus of ultrathin 2D materials
Identifikátory výsledku
Kód výsledku v IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F60461373%3A22310%2F24%3A43931445" target="_blank" >RIV/60461373:22310/24:43931445 - isvavai.cz</a>
Výsledek na webu
<a href="https://pubs.aip.org/aip/apl/article/125/25/253104/3326528/PDMS-A-simple-and-effective-platform-for" target="_blank" >https://pubs.aip.org/aip/apl/article/125/25/253104/3326528/PDMS-A-simple-and-effective-platform-for</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1063/5.0245071" target="_blank" >10.1063/5.0245071</a>
Alternativní jazyky
Jazyk výsledku
angličtina
Název v původním jazyce
PDMS-A simple and effective platform for determining Young's modulus of ultrathin 2D materials
Popis výsledku v původním jazyce
Young's modulus plays a crucial role in determining the suitability of materials for various applications, including two-dimensional (2D) materials like graphene and transition metal dichalcogenides. Traditional indentation methods struggle with ultrathin 2D materials due to substrate effects. To overcome this, we propose using polydimethylsiloxane (PDMS) as a compliant substrate for atomic force microscopy force curves. This method, building on a 1950s analytical model, allows for accurate Young's modulus estimates by measuring flake thickness, applied force, and deformation. The results from our approach aligns well with existing literature for various 2D materials. PDMS, commonly used for mechanical exfoliation and transfer, offers an easily measurable Young's modulus, facilitating more efficient determinations. As the range of ultrathin materials grows, this platform enhances accessibility and efficiency in measuring Young's modulus, significantly contributing to the advancement of applications for these innovative materials.
Název v anglickém jazyce
PDMS-A simple and effective platform for determining Young's modulus of ultrathin 2D materials
Popis výsledku anglicky
Young's modulus plays a crucial role in determining the suitability of materials for various applications, including two-dimensional (2D) materials like graphene and transition metal dichalcogenides. Traditional indentation methods struggle with ultrathin 2D materials due to substrate effects. To overcome this, we propose using polydimethylsiloxane (PDMS) as a compliant substrate for atomic force microscopy force curves. This method, building on a 1950s analytical model, allows for accurate Young's modulus estimates by measuring flake thickness, applied force, and deformation. The results from our approach aligns well with existing literature for various 2D materials. PDMS, commonly used for mechanical exfoliation and transfer, offers an easily measurable Young's modulus, facilitating more efficient determinations. As the range of ultrathin materials grows, this platform enhances accessibility and efficiency in measuring Young's modulus, significantly contributing to the advancement of applications for these innovative materials.
Klasifikace
Druh
J<sub>imp</sub> - Článek v periodiku v databázi Web of Science
CEP obor
—
OECD FORD obor
10402 - Inorganic and nuclear chemistry
Návaznosti výsledku
Projekt
Výsledek vznikl pri realizaci vícero projektů. Více informací v záložce Projekty.
Návaznosti
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Ostatní
Rok uplatnění
2024
Kód důvěrnosti údajů
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Údaje specifické pro druh výsledku
Název periodika
APPLIED PHYSICS LETTERS
ISSN
0003-6951
e-ISSN
1077-3118
Svazek periodika
125
Číslo periodika v rámci svazku
25
Stát vydavatele periodika
US - Spojené státy americké
Počet stran výsledku
5
Strana od-do
nestránkováno
Kód UT WoS článku
001381032600010
EID výsledku v databázi Scopus
2-s2.0-85212585966