CHARACTERIZATION OF THE NANOSTRUCTURED NICKEL OXIDE LAYERS PREPARED BY ION BEAM SPUTTERING

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F60461373%3A22340%2F11%3A43892102" target="_blank" >RIV/60461373:22340/11:43892102 - isvavai.cz</a>

Výsledek na webu

—

DOI - Digital Object Identifier

—

Jazyk výsledku

angličtina

Název v původním jazyce

CHARACTERIZATION OF THE NANOSTRUCTURED NICKEL OXIDE LAYERS PREPARED BY ION BEAM SPUTTERING

Popis výsledku v původním jazyce

Nanostructured nickel oxide layers (thickness cca 100 nm) were prepared by bombardment of nickel foil with ion beam created from a mixture of argon and oxygen. Different volume ratios of argon:oxygen mixture were used, ranging from 4:1 to 1:3. Composition of the resulting layers was analyzed by RBS, morphology by AFM and main crystal orientation of the sample by XRD. The electrophysical properties (resistivity, concentration of charge carriers) were measured by four point Van der Pauw technique and Hallmeasurement respectively. Prepared samples were characterized in as-deposited state and after annealing with varying temperature of treatment. Chemical composition (i.e. stoichiometry) of the as-deposited samples with different argon:oxygen ratio was related to their electrophysical parameters. Hall measurements are showing majority charge carriers to be electrons - surface concentration (0.5 - 2.3) x 1021 m-2 - suggesting prevailing metallic conductivity. Resistivity of the sample is i

Název v anglickém jazyce

CHARACTERIZATION OF THE NANOSTRUCTURED NICKEL OXIDE LAYERS PREPARED BY ION BEAM SPUTTERING

Popis výsledku anglicky

Nanostructured nickel oxide layers (thickness cca 100 nm) were prepared by bombardment of nickel foil with ion beam created from a mixture of argon and oxygen. Different volume ratios of argon:oxygen mixture were used, ranging from 4:1 to 1:3. Composition of the resulting layers was analyzed by RBS, morphology by AFM and main crystal orientation of the sample by XRD. The electrophysical properties (resistivity, concentration of charge carriers) were measured by four point Van der Pauw technique and Hallmeasurement respectively. Prepared samples were characterized in as-deposited state and after annealing with varying temperature of treatment. Chemical composition (i.e. stoichiometry) of the as-deposited samples with different argon:oxygen ratio was related to their electrophysical parameters. Hall measurements are showing majority charge carriers to be electrons - surface concentration (0.5 - 2.3) x 1021 m-2 - suggesting prevailing metallic conductivity. Resistivity of the sample is i

Druh

D - Stať ve sborníku

CEP obor

BM - Fyzika pevných látek a magnetismus

OECD FORD obor

—

Projekt

<a href="/cs/project/GAP108%2F11%2F1298" target="_blank" >GAP108/11/1298: Detekční vrstvy na bázi kompozitů organokomplexů s nanočásticemi pro chemické senzory</a><br>

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)<br>S - Specificky vyzkum na vysokych skolach

Rok uplatnění

2011

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název statě ve sborníku

NANOCON 2011

ISBN

978-80-87294-23-9

ISSN

—

e-ISSN

—

Počet stran výsledku

4

Strana od-do

1-4

Název nakladatele

TANGER

Místo vydání

Ostrava

Místo konání akce

Brno

Datum konání akce

21. 3. 2011

Typ akce podle státní příslušnosti

EUR - Evropská akce

Kód UT WoS článku

—