Measuring the effective thicknesses of optical elements knowing their dispersion and using white-light spectral interferometry

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61989100%3A27350%2F05%3A00013336" target="_blank" >RIV/61989100:27350/05:00013336 - isvavai.cz</a>

Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

Measuring the effective thicknesses of optical elements knowing their dispersion and using white-light spectral interferometry

Popis výsledku v původním jazyce

A phase-locked loop method is applied in processing the spectral interferograms resolved in a narrow spectral range in a dispersive Michelson interferometer including optical elements. The unwrapped spectral fringe phases with 2? ambiguity are determinedand a simple procedure in removing the ambiguity is applied to obtain the effective thicknesses of the optical elements knowing their dispersion. The effective thicknesses determined in two cases are compared with those obtained by measuring the equalization wavelengths. A Fourier transform method is applied in processing the spectral interferogram resolved over a wide spectral range in a slightly dispersive Michelson interferometer including a cube beamsplitter. The ambiguous spectral fringe phase isdetermined and a procedure in removing its ambiguity is applied to obtain the effective thickness of the beamsplitter.

Název v anglickém jazyce

Measuring the effective thicknesses of optical elements knowing their dispersion and using white-light spectral interferometry

Popis výsledku anglicky

A phase-locked loop method is applied in processing the spectral interferograms resolved in a narrow spectral range in a dispersive Michelson interferometer including optical elements. The unwrapped spectral fringe phases with 2? ambiguity are determinedand a simple procedure in removing the ambiguity is applied to obtain the effective thicknesses of the optical elements knowing their dispersion. The effective thicknesses determined in two cases are compared with those obtained by measuring the equalization wavelengths. A Fourier transform method is applied in processing the spectral interferogram resolved over a wide spectral range in a slightly dispersive Michelson interferometer including a cube beamsplitter. The ambiguous spectral fringe phase isdetermined and a procedure in removing its ambiguity is applied to obtain the effective thickness of the beamsplitter.

Druh

D - Stať ve sborníku

CEP obor

BH - Optika, masery a lasery

OECD FORD obor

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Projekt

<a href="/cs/project/GA202%2F03%2F0776" target="_blank" >GA202/03/0776: Magnetooptické jevy v magnetických nanostrukturách</a><br>

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2005

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název statě ve sborníku

Proceedings of SPIE

ISBN

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ISSN

0277-786X

e-ISSN

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Počet stran výsledku

10

Strana od-do

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Název nakladatele

SPIE - The International Society for Optical Engineering

Místo vydání

Bellingham

Místo konání akce

Nitra

Datum konání akce

13. 9. 2004

Typ akce podle státní příslušnosti

WRD - Celosvětová akce

Kód UT WoS článku

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