Degradace katodoluminiscence poly[methyl(phenyl)silylenu]

Kód výsledku v IS VaVaI

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Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

Degradation of Poly[methyl(phenyl)silylene] cathodoluminescence

Popis výsledku v původním jazyce

The study of the properties of poly[methyl(phenyl)silylene] (PMPSi) was based on the measurement of intensity of the cathodoluminescent (CL) emission after passing through the specimen. The major problem of the study is the susceptibility of the materialinvestigated to the degradation by electron beam. PMPSi degradation strongly decreases the CL intensity (to 40% after five minutes from the beginning of the excitation). Therefore, the measurement in the synchronous mode was used to eliminate the influence of the background and of the noise. An interaction of electrons with PMPSi causes the progressive scission of weak Si - Si bonds in the main chain of the material and leads to the formation of silyl radicals. A series of subsequent reactions of the radicals is possible, which complicates the process of degradation. It was found that the degradation process is partly reversible.

Název v anglickém jazyce

Degradation of Poly[methyl(phenyl)silylene] cathodoluminescence

Popis výsledku anglicky

The study of the properties of poly[methyl(phenyl)silylene] (PMPSi) was based on the measurement of intensity of the cathodoluminescent (CL) emission after passing through the specimen. The major problem of the study is the susceptibility of the materialinvestigated to the degradation by electron beam. PMPSi degradation strongly decreases the CL intensity (to 40% after five minutes from the beginning of the excitation). Therefore, the measurement in the synchronous mode was used to eliminate the influence of the background and of the noise. An interaction of electrons with PMPSi causes the progressive scission of weak Si - Si bonds in the main chain of the material and leads to the formation of silyl radicals. A series of subsequent reactions of the radicals is possible, which complicates the process of degradation. It was found that the degradation process is partly reversible.

Druh

D - Stať ve sborníku

CEP obor

JA - Elektronika a optoelektronika, elektrotechnika

OECD FORD obor

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Projekt

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Návaznosti

Z - Vyzkumny zamer (s odkazem do CEZ)

Rok uplatnění

2005

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název statě ve sborníku

2nd European Weathering Symposium on Natural and Artificial Ageing of Polymers

ISBN

3-9808382-9-3

ISSN

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e-ISSN

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Počet stran výsledku

9

Strana od-do

311-319

Název nakladatele

Gesellschaft für Umweltsimulation GUS

Místo vydání

Pfinztal

Místo konání akce

Gothenburg

Datum konání akce

16. 6. 2005

Typ akce podle státní příslušnosti

WRD - Celosvětová akce

Kód UT WoS článku

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