Scanning Electron Microscopy with Samples in an Electric Field

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F12%3A00385193" target="_blank" >RIV/68081731:_____/12:00385193 - isvavai.cz</a>

Výsledek na webu

<a href="http://dx.doi.org/10.3390/ma5122731" target="_blank" >http://dx.doi.org/10.3390/ma5122731</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.3390/ma5122731" target="_blank" >10.3390/ma5122731</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Scanning Electron Microscopy with Samples in an Electric Field

Popis výsledku v původním jazyce

The high negative bias of a sample in a scanning electron microscope constitutes the ?cathode lens with a strong electric field just above the sample surface. This mode offers a convenient tool for controlling the landing energy of electrons down to units or even fractions of electronvolts with only slight readjustments of the column. Moreover, the field accelerates and collimates the signal electrons to earthed detectors above and below the sample, thereby assuring high collection efficiency and high amplification of the image signal. One important feature is the ability to acquire the complete emission of the backscattered electrons, including those emitted at high angles with respect to the surface normal. The cathode lens aberrations are proportional to the landing energy of electrons so the spot size becomes nearly constant throughout the full energy scale. At low energies and with their complete angular distribution acquired, the backscattered electron images offer enhanced infor

Název v anglickém jazyce

Scanning Electron Microscopy with Samples in an Electric Field

Popis výsledku anglicky

The high negative bias of a sample in a scanning electron microscope constitutes the ?cathode lens with a strong electric field just above the sample surface. This mode offers a convenient tool for controlling the landing energy of electrons down to units or even fractions of electronvolts with only slight readjustments of the column. Moreover, the field accelerates and collimates the signal electrons to earthed detectors above and below the sample, thereby assuring high collection efficiency and high amplification of the image signal. One important feature is the ability to acquire the complete emission of the backscattered electrons, including those emitted at high angles with respect to the surface normal. The cathode lens aberrations are proportional to the landing energy of electrons so the spot size becomes nearly constant throughout the full energy scale. At low energies and with their complete angular distribution acquired, the backscattered electron images offer enhanced infor

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

JA - Elektronika a optoelektronika, elektrotechnika

OECD FORD obor

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Projekt

Výsledek vznikl pri realizaci vícero projektů. Více informací v záložce Projekty.

Návaznosti

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Rok uplatnění

2012

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Materials

ISSN

1996-1944

e-ISSN

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Svazek periodika

5

Číslo periodika v rámci svazku

12

Stát vydavatele periodika

CH - Švýcarská konfederace

Počet stran výsledku

26

Strana od-do

2731-2756

Kód UT WoS článku

000312608500016

EID výsledku v databázi Scopus

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