Imaging of carbon nanostructures by low energy STEM below 5 keV

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F14%3A00434115" target="_blank" >RIV/68081731:_____/14:00434115 - isvavai.cz</a>

Výsledek na webu

—

DOI - Digital Object Identifier

—

Jazyk výsledku

angličtina

Název v původním jazyce

Imaging of carbon nanostructures by low energy STEM below 5 keV

Popis výsledku v původním jazyce

Our work deals with the imaging of nanostructures composed of light biogenic elements, such as carbon nanotubes, by low energy scanning transmission electron microscopy (STEM). Compared to imaging at the voltages commonly used for TEM and STEM, low energy electrons seem very promising in terms of specimen damage that is caused by a number of elastic andn inelastic collisions. In carbonaceous materials, the most problematic is probably the knock-on damage, where the structure can be impaired by carbon atom displacement. To avoid this problem with structures composed of light elements, a reduction in beam voltage going down to 5 keV has recently been proposed. The range below 5 keV has not been explored yet for this purpose, although electron scatteringin matter is lower for these energies, which allows achieving a higher spatial resolution. We aim to demonstrate that additional reduction of incident electron energy may yield interesting contrast features.

Název v anglickém jazyce

Imaging of carbon nanostructures by low energy STEM below 5 keV

Popis výsledku anglicky

Our work deals with the imaging of nanostructures composed of light biogenic elements, such as carbon nanotubes, by low energy scanning transmission electron microscopy (STEM). Compared to imaging at the voltages commonly used for TEM and STEM, low energy electrons seem very promising in terms of specimen damage that is caused by a number of elastic andn inelastic collisions. In carbonaceous materials, the most problematic is probably the knock-on damage, where the structure can be impaired by carbon atom displacement. To avoid this problem with structures composed of light elements, a reduction in beam voltage going down to 5 keV has recently been proposed. The range below 5 keV has not been explored yet for this purpose, although electron scatteringin matter is lower for these energies, which allows achieving a higher spatial resolution. We aim to demonstrate that additional reduction of incident electron energy may yield interesting contrast features.

Druh

D - Stať ve sborníku

CEP obor

JA - Elektronika a optoelektronika, elektrotechnika

OECD FORD obor

—

Projekt

<a href="/cs/project/LO1212" target="_blank" >LO1212: ALISI - Centrum pokročilých diagnostických metod a technologií</a><br>

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2014

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název statě ve sborníku

18th International Microscopy Congres. Proceedings

ISBN

978-80-260-6720-7

ISSN

—

e-ISSN

—

Počet stran výsledku

2

Strana od-do

—

Název nakladatele

Czechoslovak Microscopy Society

Místo vydání

Praha

Místo konání akce

Praha

Datum konání akce

7. 9. 2014

Typ akce podle státní příslušnosti

WRD - Celosvětová akce

Kód UT WoS článku

—