Examination of Graphene in a Scanning Low Energy Electron Microscope
Identifikátory výsledku
Kód výsledku v IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F15%3A00450818" target="_blank" >RIV/68081731:_____/15:00450818 - isvavai.cz</a>
Výsledek na webu
<a href="http://dx.doi.org/10.1017/S143192761500094X" target="_blank" >http://dx.doi.org/10.1017/S143192761500094X</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1017/S143192761500094X" target="_blank" >10.1017/S143192761500094X</a>
Alternativní jazyky
Jazyk výsledku
angličtina
Název v původním jazyce
Examination of Graphene in a Scanning Low Energy Electron Microscope
Popis výsledku v původním jazyce
Although graphene has been available and intensively studied for a full decade, new methods are still required for its examination and diagnostics. Even checking the continuity of layers and the reliable counting of layers of graphene and other 2D crystals should be easier to perform. Scanning low energy electron microscope (SLEEM) equipped with a cathode lens offers an innovative tool enabling one to see graphene samples at nanometer lateral resolution in both transmitted and reflected electrons and tocount the number of layers. This diagnostics can be performed on freestanding graphene samples as well as on graphene grown on the surfaces of bulk substrates. The freestanding graphene samples were first examined in the standard vacuum high resolutionSLEEM. Fig. 1 shows micrographs taken in the reflected electron (RE) as well as transmitted electron (TE) mode at several energies. The RE signal was composed of both secondary and backscattered electron emission, accelerated in the catho
Název v anglickém jazyce
Examination of Graphene in a Scanning Low Energy Electron Microscope
Popis výsledku anglicky
Although graphene has been available and intensively studied for a full decade, new methods are still required for its examination and diagnostics. Even checking the continuity of layers and the reliable counting of layers of graphene and other 2D crystals should be easier to perform. Scanning low energy electron microscope (SLEEM) equipped with a cathode lens offers an innovative tool enabling one to see graphene samples at nanometer lateral resolution in both transmitted and reflected electrons and tocount the number of layers. This diagnostics can be performed on freestanding graphene samples as well as on graphene grown on the surfaces of bulk substrates. The freestanding graphene samples were first examined in the standard vacuum high resolutionSLEEM. Fig. 1 shows micrographs taken in the reflected electron (RE) as well as transmitted electron (TE) mode at several energies. The RE signal was composed of both secondary and backscattered electron emission, accelerated in the catho
Klasifikace
Druh
J<sub>x</sub> - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)
CEP obor
JA - Elektronika a optoelektronika, elektrotechnika
OECD FORD obor
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Návaznosti výsledku
Projekt
<a href="/cs/project/LO1212" target="_blank" >LO1212: ALISI - Centrum pokročilých diagnostických metod a technologií</a><br>
Návaznosti
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Ostatní
Rok uplatnění
2015
Kód důvěrnosti údajů
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Údaje specifické pro druh výsledku
Název periodika
Microscopy and Microanalysis
ISSN
1431-9276
e-ISSN
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Svazek periodika
21
Číslo periodika v rámci svazku
S3
Stát vydavatele periodika
US - Spojené státy americké
Počet stran výsledku
2
Strana od-do
29-30
Kód UT WoS článku
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EID výsledku v databázi Scopus
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