Examination of Graphene in a Scanning Low Energy Electron Microscope

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F15%3A00450818" target="_blank" >RIV/68081731:_____/15:00450818 - isvavai.cz</a>

Výsledek na webu

<a href="http://dx.doi.org/10.1017/S143192761500094X" target="_blank" >http://dx.doi.org/10.1017/S143192761500094X</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1017/S143192761500094X" target="_blank" >10.1017/S143192761500094X</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Examination of Graphene in a Scanning Low Energy Electron Microscope

Popis výsledku v původním jazyce

Although graphene has been available and intensively studied for a full decade, new methods are still required for its examination and diagnostics. Even checking the continuity of layers and the reliable counting of layers of graphene and other 2D crystals should be easier to perform. Scanning low energy electron microscope (SLEEM) equipped with a cathode lens offers an innovative tool enabling one to see graphene samples at nanometer lateral resolution in both transmitted and reflected electrons and tocount the number of layers. This diagnostics can be performed on freestanding graphene samples as well as on graphene grown on the surfaces of bulk substrates. The freestanding graphene samples were first examined in the standard vacuum high resolutionSLEEM. Fig. 1 shows micrographs taken in the reflected electron (RE) as well as transmitted electron (TE) mode at several energies. The RE signal was composed of both secondary and backscattered electron emission, accelerated in the catho

Název v anglickém jazyce

Examination of Graphene in a Scanning Low Energy Electron Microscope

Popis výsledku anglicky

Although graphene has been available and intensively studied for a full decade, new methods are still required for its examination and diagnostics. Even checking the continuity of layers and the reliable counting of layers of graphene and other 2D crystals should be easier to perform. Scanning low energy electron microscope (SLEEM) equipped with a cathode lens offers an innovative tool enabling one to see graphene samples at nanometer lateral resolution in both transmitted and reflected electrons and tocount the number of layers. This diagnostics can be performed on freestanding graphene samples as well as on graphene grown on the surfaces of bulk substrates. The freestanding graphene samples were first examined in the standard vacuum high resolutionSLEEM. Fig. 1 shows micrographs taken in the reflected electron (RE) as well as transmitted electron (TE) mode at several energies. The RE signal was composed of both secondary and backscattered electron emission, accelerated in the catho

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

JA - Elektronika a optoelektronika, elektrotechnika

OECD FORD obor

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Projekt

<a href="/cs/project/LO1212" target="_blank" >LO1212: ALISI - Centrum pokročilých diagnostických metod a technologií</a><br>

Návaznosti

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Rok uplatnění

2015

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Microscopy and Microanalysis

ISSN

1431-9276

e-ISSN

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Svazek periodika

21

Číslo periodika v rámci svazku

S3

Stát vydavatele periodika

US - Spojené státy americké

Počet stran výsledku

2

Strana od-do

29-30

Kód UT WoS článku

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EID výsledku v databázi Scopus

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