Very low energy STEM/TOF system

Kód výsledku v IS VaVaI

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Výsledek na webu

<a href="http://www.trends.isibrno.cz/" target="_blank" >http://www.trends.isibrno.cz/</a>

DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

Very low energy STEM/TOF system

Popis výsledku v původním jazyce

Scanning low energy electron microscopes (SLEEMs) have been built at ISI for over 20 years, either by modification of commercially available SEMs with a cathode lens or completely self-built in case of a dedicated ultra-high vacuum scanning low energy electron microscope (UHV SLEEM). Recently, the range of detection methods has been extendednby a detector for electrons transmitted through ultrathin films and 2D crystals like graphene. For a better understanding of interaction between low energy electrons and solids in general, and the image contrast mechanism in particular, it was considered useful to measure the energy of transmitted electrons. This allows a better comparison with simulations, which suffer from increasing complexity due to a stronger interaction of electrons with the density of states at low energies.

Název v anglickém jazyce

Very low energy STEM/TOF system

Popis výsledku anglicky

Scanning low energy electron microscopes (SLEEMs) have been built at ISI for over 20 years, either by modification of commercially available SEMs with a cathode lens or completely self-built in case of a dedicated ultra-high vacuum scanning low energy electron microscope (UHV SLEEM). Recently, the range of detection methods has been extendednby a detector for electrons transmitted through ultrathin films and 2D crystals like graphene. For a better understanding of interaction between low energy electrons and solids in general, and the image contrast mechanism in particular, it was considered useful to measure the energy of transmitted electrons. This allows a better comparison with simulations, which suffer from increasing complexity due to a stronger interaction of electrons with the density of states at low energies.

Druh

D - Stať ve sborníku

CEP obor

JA - Elektronika a optoelektronika, elektrotechnika

OECD FORD obor

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Projekt

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Návaznosti

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Rok uplatnění

2016

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název statě ve sborníku

Proceedings of the 15th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation

ISBN

978-80-87441-17-6

ISSN

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e-ISSN

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Počet stran výsledku

2

Strana od-do

6-7

Název nakladatele

Institute of Scientific Instruments CAS

Místo vydání

Brno

Místo konání akce

Skalský dvůr

Datum konání akce

29. 5. 2016

Typ akce podle státní příslušnosti

WRD - Celosvětová akce

Kód UT WoS článku

000391254000001