Superfast scintillators for SEM electron detectors

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F17%3A00481584" target="_blank" >RIV/68081731:_____/17:00481584 - isvavai.cz</a>

Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

Superfast scintillators for SEM electron detectors

Popis výsledku v původním jazyce

Scanning electron microscopes (SEM) require a high-quality electron detector. Such an electron detector must primarily be very fast to process a large number of imaging data in real time. For example, for the acquisition of a high-quality image in a scanning electron microscope (SEM) in real time, it is usually required to process each pixel in less than 100 ns without a loss of contrast. If the mentioned electron detectors are to be formed by scintillation detection systems, they must be equipped with very fast scintillators having a short decay time (decay to 1/e value, where e is the base of natural logarithms) and low afterglow even at a microsecond time range after an excitation cut-off. The scintillator with the long decay time causes an image blur and the scintillator with the high afterglow reduces image contrast in the SEM. In the scintillation electron detectors, Czochralski grown single-crystal scintillators such as YAG:Ce and YAP:Ce, whose cathodoluminescence (CL) properties have been thoroughly studied, are commonly used.

Název v anglickém jazyce

Superfast scintillators for SEM electron detectors

Popis výsledku anglicky

Scanning electron microscopes (SEM) require a high-quality electron detector. Such an electron detector must primarily be very fast to process a large number of imaging data in real time. For example, for the acquisition of a high-quality image in a scanning electron microscope (SEM) in real time, it is usually required to process each pixel in less than 100 ns without a loss of contrast. If the mentioned electron detectors are to be formed by scintillation detection systems, they must be equipped with very fast scintillators having a short decay time (decay to 1/e value, where e is the base of natural logarithms) and low afterglow even at a microsecond time range after an excitation cut-off. The scintillator with the long decay time causes an image blur and the scintillator with the high afterglow reduces image contrast in the SEM. In the scintillation electron detectors, Czochralski grown single-crystal scintillators such as YAG:Ce and YAP:Ce, whose cathodoluminescence (CL) properties have been thoroughly studied, are commonly used.

Druh

D - Stať ve sborníku

CEP obor

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OECD FORD obor

20201 - Electrical and electronic engineering

Projekt

Výsledek vznikl pri realizaci vícero projektů. Více informací v záložce Projekty.

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2017

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název statě ve sborníku

13th Multinational Congress on Microscopy: Book of Abstracts

ISBN

978-953-7941-19-2

ISSN

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e-ISSN

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Počet stran výsledku

2

Strana od-do

132-133

Název nakladatele

Ruder Bošković Institute, Croatian Microscopy Society

Místo vydání

Zagreb

Místo konání akce

Rovinj

Datum konání akce

24. 9. 2017

Typ akce podle státní příslušnosti

WRD - Celosvětová akce

Kód UT WoS článku

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