The role of the pulsed laser deposition in different growth atmospheres on the gas-sensing properties of ZnO films

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F23%3A00572400" target="_blank" >RIV/68378271:_____/23:00572400 - isvavai.cz</a>

Výsledek na webu

<a href="https://doi.org/10.1016/j.snb.2023.133454" target="_blank" >https://doi.org/10.1016/j.snb.2023.133454</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1016/j.snb.2023.133454" target="_blank" >10.1016/j.snb.2023.133454</a>

Jazyk výsledku

angličtina

Název v původním jazyce

The role of the pulsed laser deposition in different growth atmospheres on the gas-sensing properties of ZnO films

Popis výsledku v původním jazyce

ZnO films were fabricated by pulsed laser deposition using two different background atmospheres (argon/vacuum). The gas-sensing properties of these materials against reducing and oxidizing gases were examined. The microstructure and crystal symmetry of the deposited films were studied with X-ray diffraction (XRD), Scanning electron microscopy (SEM), X-ray photoelectron spectroscopy (XPS), Raman, and Photoluminescence (PL) spectroscopy. The XRD studies revealed that the ZnO films grown in an argon environment are highly textured in the c-axis with a hexagonal crystalline structure. The c-axis is perpendicular to the substrate plane orientation (002) compared to (100) plane orientation, which is developed in a vacuum environment. Usually, this orientation (100) is difficult to obtain. Raman scattering spectra for both types of ZnO films revealed the characteristic E2 (high) mode that is related to the vibration of oxygen atoms in wurtzite ZnO.

Název v anglickém jazyce

The role of the pulsed laser deposition in different growth atmospheres on the gas-sensing properties of ZnO films

Popis výsledku anglicky

ZnO films were fabricated by pulsed laser deposition using two different background atmospheres (argon/vacuum). The gas-sensing properties of these materials against reducing and oxidizing gases were examined. The microstructure and crystal symmetry of the deposited films were studied with X-ray diffraction (XRD), Scanning electron microscopy (SEM), X-ray photoelectron spectroscopy (XPS), Raman, and Photoluminescence (PL) spectroscopy. The XRD studies revealed that the ZnO films grown in an argon environment are highly textured in the c-axis with a hexagonal crystalline structure. The c-axis is perpendicular to the substrate plane orientation (002) compared to (100) plane orientation, which is developed in a vacuum environment. Usually, this orientation (100) is difficult to obtain. Raman scattering spectra for both types of ZnO films revealed the characteristic E2 (high) mode that is related to the vibration of oxygen atoms in wurtzite ZnO.

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

20501 - Materials engineering

Projekt

—

Návaznosti

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Rok uplatnění

2023

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Sensors and Actuators B - Chemical

ISSN

0925-4005

e-ISSN

0925-4005

Svazek periodika

382

Číslo periodika v rámci svazku

May

Stát vydavatele periodika

NL - Nizozemsko

Počet stran výsledku

10

Strana od-do

133454

Kód UT WoS článku

000979563800001

EID výsledku v databázi Scopus

2-s2.0-85147767260