Dynamic Testing of 16 bit ADC with Sinewave and Stochastic Signals

Kód výsledku v IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F03%3A03088461" target="_blank" >RIV/68407700:21230/03:03088461 - isvavai.cz</a>
Výsledek na webu
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Jazyk výsledku
angličtina
Název v původním jazyce
Dynamic Testing of 16 bit ADC with Sinewave and Stochastic Signals
Popis výsledku v původním jazyce
High-linearity and high-resolution AD converters that are difficult to test by standard methods using deterministic signal can be tested by means of stochastic test methods Histogram test can use various input signals and principally allows use noise asthe input signal. To overcome difficulties related to generation of large-scale uniformly distributed stochastic signal, a method based on superposition of Gaussian noises with equidistantly spaced DC shifts has been proposed and theoretical analysis hasbeen provided there.
Název v anglickém jazyce
Dynamic Testing of 16 bit ADC with Sinewave and Stochastic Signals
Popis výsledku anglicky
High-linearity and high-resolution AD converters that are difficult to test by standard methods using deterministic signal can be tested by means of stochastic test methods Histogram test can use various input signals and principally allows use noise asthe input signal. To overcome difficulties related to generation of large-scale uniformly distributed stochastic signal, a method based on superposition of Gaussian noises with equidistantly spaced DC shifts has been proposed and theoretical analysis hasbeen provided there.

Rok uplatnění
2003
Kód důvěrnosti údajů
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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