ESD MOSFET model calibration by differential evolutionary optimization algorithm

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F12%3A00204620" target="_blank" >RIV/68407700:21230/12:00204620 - isvavai.cz</a>

Výsledek na webu

<a href="http://147.228.94.30/index.php?option=com_content&view=article&id=356:esd-mosfet-model-calibration-by-differential-evolutionary-optimization-algorithm&catid=42:cislo-62012-eds-2012&Itemid=49" target="_blank" >http://147.228.94.30/index.php?option=com_content&view=article&id=356:esd-mosfet-model-calibration-by-differential-evolutionary-optimization-algorithm&catid=42:cislo-62012-eds-2012&Itemid=49</a>

DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

ESD MOSFET model calibration by differential evolutionary optimization algorithm

Popis výsledku v původním jazyce

The aim of this paper is to present the utilization of modern optimization algorithm called Differential Evolution to automatically fit the measured data from test chip to the appropriate electrostatic discharge (ESD) model without the need of manual model-parameters tuning. In contrast with proposed method the traditional approach can be very time and resource consuming. To the best knowledge of the authors, this novel approach has never been previously used. Short introduction to ESD NMOST function and properties are presented along with basic overview of differential evolutionary optimization algorithm. Results of fitting the technology-optimized macro-model of NMOST to the simple piece-wise linear model of MOSFET snapback I-V characteristic will bepresented.

Název v anglickém jazyce

ESD MOSFET model calibration by differential evolutionary optimization algorithm

Popis výsledku anglicky

The aim of this paper is to present the utilization of modern optimization algorithm called Differential Evolution to automatically fit the measured data from test chip to the appropriate electrostatic discharge (ESD) model without the need of manual model-parameters tuning. In contrast with proposed method the traditional approach can be very time and resource consuming. To the best knowledge of the authors, this novel approach has never been previously used. Short introduction to ESD NMOST function and properties are presented along with basic overview of differential evolutionary optimization algorithm. Results of fitting the technology-optimized macro-model of NMOST to the simple piece-wise linear model of MOSFET snapback I-V characteristic will bepresented.

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

JA - Elektronika a optoelektronika, elektrotechnika

OECD FORD obor

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Projekt

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Návaznosti

S - Specificky vyzkum na vysokych skolach

Rok uplatnění

2012

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

ElectroScope

ISSN

1802-4564

e-ISSN

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Svazek periodika

2012

Číslo periodika v rámci svazku

6

Stát vydavatele periodika

CZ - Česká republika

Počet stran výsledku

7

Strana od-do

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Kód UT WoS článku

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EID výsledku v databázi Scopus

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