On don't cares in test compression
Identifikátory výsledku
Kód výsledku v IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21240%2F14%3A00221781" target="_blank" >RIV/68407700:21240/14:00221781 - isvavai.cz</a>
Výsledek na webu
<a href="http://dx.doi.org/10.1016/j.micpro.2014.07.006" target="_blank" >http://dx.doi.org/10.1016/j.micpro.2014.07.006</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1016/j.micpro.2014.07.006" target="_blank" >10.1016/j.micpro.2014.07.006</a>
Alternativní jazyky
Jazyk výsledku
angličtina
Název v původním jazyce
On don't cares in test compression
Popis výsledku v původním jazyce
Both test compression tools and ATPGs directly producing compressed test greatly benefit from don?t care values present in the test. Actually, presence of these don?t cares is essential for success of the compression. Contemporary ATPGs produce tests having more than 97% of don?t cares for large industrial circuits, thus high compression ratios can be expected. However, these don?t cares are placed in the test in an ?uninformed? way. There are many possibilities of constructing a complete test for a circuit, while the ATPG chooses just one particular, without respect to the subsequent compression process. Therefore, the don?t cares cannot be fully exploited. In this paper we show how severe this issue is. A novel ATPG algorithm directly producing compressed test patterns for the RESPIN decompression architecture is presented. Test don?t cares are placed in an informed way, so that they are maximally exploited by compression. We compare the results with several ways of uninformed don?t
Název v anglickém jazyce
On don't cares in test compression
Popis výsledku anglicky
Both test compression tools and ATPGs directly producing compressed test greatly benefit from don?t care values present in the test. Actually, presence of these don?t cares is essential for success of the compression. Contemporary ATPGs produce tests having more than 97% of don?t cares for large industrial circuits, thus high compression ratios can be expected. However, these don?t cares are placed in the test in an ?uninformed? way. There are many possibilities of constructing a complete test for a circuit, while the ATPG chooses just one particular, without respect to the subsequent compression process. Therefore, the don?t cares cannot be fully exploited. In this paper we show how severe this issue is. A novel ATPG algorithm directly producing compressed test patterns for the RESPIN decompression architecture is presented. Test don?t cares are placed in an informed way, so that they are maximally exploited by compression. We compare the results with several ways of uninformed don?t
Klasifikace
Druh
J<sub>x</sub> - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)
CEP obor
JC - Počítačový hardware a software
OECD FORD obor
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Návaznosti výsledku
Projekt
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Návaznosti
S - Specificky vyzkum na vysokych skolach<br>I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Ostatní
Rok uplatnění
2014
Kód důvěrnosti údajů
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Údaje specifické pro druh výsledku
Název periodika
Microprocessors and Microsystems
ISSN
0141-9331
e-ISSN
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Svazek periodika
38
Číslo periodika v rámci svazku
8
Stát vydavatele periodika
NL - Nizozemsko
Počet stran výsledku
12
Strana od-do
754-765
Kód UT WoS článku
000347755200003
EID výsledku v databázi Scopus
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