ZATPG: SAT-based Test Patterns Generator with Zero-Aliasing in Temporal Compaction

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21240%2F18%3A00321779" target="_blank" >RIV/68407700:21240/18:00321779 - isvavai.cz</a>

Výsledek na webu

<a href="https://www.sciencedirect.com/science/article/pii/S0141933118300966" target="_blank" >https://www.sciencedirect.com/science/article/pii/S0141933118300966</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1016/j.micpro.2018.05.001" target="_blank" >10.1016/j.micpro.2018.05.001</a>

Jazyk výsledku

angličtina

Název v původním jazyce

ZATPG: SAT-based Test Patterns Generator with Zero-Aliasing in Temporal Compaction

Popis výsledku v původním jazyce

Aliasing in test response compaction is an important source of fault coverage loss. Methods to avoid the aliasing mostly require modification of the compactor to some extent. This can lead to a higher compactor complexity and consequently to higher area overhead, longer signal propagation delays, etc. In contrast to this standard approach, we propose a novel method, the Zero-aliasing ATPG (ZATPG), which is able to reduce the aliasing for any compactor used, thus without need of the compactor modification or redesign. This is achieved by constraining the test pattern generation process (ATPG), so that patterns exhibiting no aliasing are produced directly. Aliasing in both the spatial and temporal compactors is assumed. The method is based on modification of very basic SAT-based ATPG principles, thus any SAT-based ATPG can be used for its purpose. Also, the method is general enough to be applicable to any compactor design. We demonstrate our method on MISR compactors based on LFSR and cellular automata, using the single stuck-at fault model. Our method is able to find a test with zero aliasing and complete fault coverage for smaller compactors than a conventional, unguided ATPG. Thus, the area overhead of the compactor can be reduced, while the complete fault coverage is preserved.

Název v anglickém jazyce

ZATPG: SAT-based Test Patterns Generator with Zero-Aliasing in Temporal Compaction

Popis výsledku anglicky

Aliasing in test response compaction is an important source of fault coverage loss. Methods to avoid the aliasing mostly require modification of the compactor to some extent. This can lead to a higher compactor complexity and consequently to higher area overhead, longer signal propagation delays, etc. In contrast to this standard approach, we propose a novel method, the Zero-aliasing ATPG (ZATPG), which is able to reduce the aliasing for any compactor used, thus without need of the compactor modification or redesign. This is achieved by constraining the test pattern generation process (ATPG), so that patterns exhibiting no aliasing are produced directly. Aliasing in both the spatial and temporal compactors is assumed. The method is based on modification of very basic SAT-based ATPG principles, thus any SAT-based ATPG can be used for its purpose. Also, the method is general enough to be applicable to any compactor design. We demonstrate our method on MISR compactors based on LFSR and cellular automata, using the single stuck-at fault model. Our method is able to find a test with zero aliasing and complete fault coverage for smaller compactors than a conventional, unguided ATPG. Thus, the area overhead of the compactor can be reduced, while the complete fault coverage is preserved.

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

20206 - Computer hardware and architecture

Projekt

<a href="/cs/project/GA16-05179S" target="_blank" >GA16-05179S: Výzkum vztahů a společných vlastností spolehlivých a bezpečných architektur založených na programovatelných obvodech</a><br>

Návaznosti

S - Specificky vyzkum na vysokych skolach

Rok uplatnění

2018

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Microprocessors and Microsystems

ISSN

0141-9331

e-ISSN

1872-9436

Svazek periodika

2018

Číslo periodika v rámci svazku

61

Stát vydavatele periodika

NL - Nizozemsko

Počet stran výsledku

15

Strana od-do

43-57

Kód UT WoS článku

000441486700005

EID výsledku v databázi Scopus

2-s2.0-85048504988