Pokroky rtg optiky na křemíkových deskách a skleněných foliích

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21340%2F08%3A04152551" target="_blank" >RIV/68407700:21340/08:04152551 - isvavai.cz</a>

Nalezeny alternativní kódy

RIV/67985815:_____/08:00357504

Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

Recent Progress with X-ray Optics Based on Si Wafers and Glass Foils

Popis výsledku v původním jazyce

We report on recent progress with development of astronomical X-ray optics based on thermally formed glass foils and on bent Si wafers. Experiments with thermal glass forming have continued adding wider range of evaluated and optimized parameters. Recentefforts with Si wafers have been focused on their quality improvements such as flatness and thickness uniformity in order to better meet the requirements of future X-ray astronomy projects applications, as well as on study of their surface quality, defects analysis, and methods for its reproducible measurement. The role of substrates quality in performance of final mirror arrays, as required by large future space X-ray astronomy experiments was also studied. The problem of increasing size of Si wafers,required for some X-ray optics applications, is also addressed. First results of irradiation tests of selected substrates are also reported and discussed.

Název v anglickém jazyce

Recent Progress with X-ray Optics Based on Si Wafers and Glass Foils

Popis výsledku anglicky

We report on recent progress with development of astronomical X-ray optics based on thermally formed glass foils and on bent Si wafers. Experiments with thermal glass forming have continued adding wider range of evaluated and optimized parameters. Recentefforts with Si wafers have been focused on their quality improvements such as flatness and thickness uniformity in order to better meet the requirements of future X-ray astronomy projects applications, as well as on study of their surface quality, defects analysis, and methods for its reproducible measurement. The role of substrates quality in performance of final mirror arrays, as required by large future space X-ray astronomy experiments was also studied. The problem of increasing size of Si wafers,required for some X-ray optics applications, is also addressed. First results of irradiation tests of selected substrates are also reported and discussed.

Druh

D - Stať ve sborníku

CEP obor

BH - Optika, masery a lasery

OECD FORD obor

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Projekt

<a href="/cs/project/GP202%2F07%2FP510" target="_blank" >GP202/07/P510: Inovovaná ultralehká rentgenová optika pro budoucí velké kosmické teleskopy</a><br>

Návaznosti

S - Specificky vyzkum na vysokych skolach

Rok uplatnění

2008

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název statě ve sborníku

Proceeding of SPIE 7011 - Space Telescopes and Instrumentation 2008: Ultraviolet to Gamma Ray

ISBN

978-0-8194-7221-2

ISSN

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e-ISSN

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Počet stran výsledku

23

Strana od-do

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Název nakladatele

SPIE

Místo vydání

Bellingham

Místo konání akce

Marseille

Datum konání akce

23. 6. 2008

Typ akce podle státní příslušnosti

WRD - Celosvětová akce

Kód UT WoS článku

000259563700034