INTENSITY DISTRIBUTION MODULATION OF MULTIPLE BEAM INTERFERENCE PATTERN
Identifikátory výsledku
Kód výsledku v IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21340%2F19%3A00340453" target="_blank" >RIV/68407700:21340/19:00340453 - isvavai.cz</a>
Nalezeny alternativní kódy
RIV/68378271:_____/19:00567486
Výsledek na webu
<a href="https://doi.org/10.17973/MMSJ.2019_12_2019017" target="_blank" >https://doi.org/10.17973/MMSJ.2019_12_2019017</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.17973/MMSJ.2019_12_2019017" target="_blank" >10.17973/MMSJ.2019_12_2019017</a>
Alternativní jazyky
Jazyk výsledku
angličtina
Název v původním jazyce
INTENSITY DISTRIBUTION MODULATION OF MULTIPLE BEAM INTERFERENCE PATTERN
Popis výsledku v původním jazyce
Nanostructuring and microstructuring approaches frequently used in microelectronics manufacturing, such as electron beam lithography or nanoimprint lithography, are considerably slow. In order to reduce processing time, laser patterning methods based on interference of multiple beams have been developed. Within one laser pulse, a significant part of an irradiated area on a sample surface is patterned with desired micro- or sub-microstructures. Nowadays, interference patterning goes beyond periodic lines and dots. Controlling the number of interfering beams, orientation of polarization vectors, relative phase shift, and the beam angle of incidence allows to customize the intensity distribution on the sample surface. Simulations of various interference patterns were calculated and verified on CMOS camera using 1030 nm laser diode. Based on these results, dot and line-like interference patterns were directly imprinted on the surface of carbon fiber reinforced polyether ether ketone plate by 1.8 ps, 11 mJ laser pulses at 1030 nm.
Název v anglickém jazyce
INTENSITY DISTRIBUTION MODULATION OF MULTIPLE BEAM INTERFERENCE PATTERN
Popis výsledku anglicky
Nanostructuring and microstructuring approaches frequently used in microelectronics manufacturing, such as electron beam lithography or nanoimprint lithography, are considerably slow. In order to reduce processing time, laser patterning methods based on interference of multiple beams have been developed. Within one laser pulse, a significant part of an irradiated area on a sample surface is patterned with desired micro- or sub-microstructures. Nowadays, interference patterning goes beyond periodic lines and dots. Controlling the number of interfering beams, orientation of polarization vectors, relative phase shift, and the beam angle of incidence allows to customize the intensity distribution on the sample surface. Simulations of various interference patterns were calculated and verified on CMOS camera using 1030 nm laser diode. Based on these results, dot and line-like interference patterns were directly imprinted on the surface of carbon fiber reinforced polyether ether ketone plate by 1.8 ps, 11 mJ laser pulses at 1030 nm.
Klasifikace
Druh
J<sub>SC</sub> - Článek v periodiku v databázi SCOPUS
CEP obor
—
OECD FORD obor
10306 - Optics (including laser optics and quantum optics)
Návaznosti výsledku
Projekt
—
Návaznosti
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Ostatní
Rok uplatnění
2019
Kód důvěrnosti údajů
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Údaje specifické pro druh výsledku
Název periodika
MM Science Journal
ISSN
1803-1269
e-ISSN
1805-0476
Svazek periodika
—
Číslo periodika v rámci svazku
12
Stát vydavatele periodika
CZ - Česká republika
Počet stran výsledku
5
Strana od-do
3652-3656
Kód UT WoS článku
—
EID výsledku v databázi Scopus
2-s2.0-85076599510